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Physics-Driven Dual- Defect Model Fits of Voltage Step-Up to Breakdown Data in Spacecraft Polymers

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dc.contributor.author Andersen, Allen
dc.contributor.author Dennison, JR
dc.date.accessioned 2021-05-03T19:03:31Z
dc.date.available 2021-05-03T19:03:31Z
dc.date.issued 2019-10-20
dc.identifier.citation The 2019 Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Richland, Washington, October 20-23, 2019 en_US
dc.identifier.clearanceno 19-6462
dc.identifier.uri http://hdl.handle.net/2014/51880
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2019 en_US
dc.title Physics-Driven Dual- Defect Model Fits of Voltage Step-Up to Breakdown Data in Spacecraft Polymers en_US
dc.type Presentation en_US


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