SEE testing of the Snapdragon 820: on-site annealing and POP challenges

Guertin, Steven M.; Vartanian, Sergeh; Cui, Matthew

dc.contributor.author	Guertin, Steven M.
dc.contributor.author	Vartanian, Sergeh
dc.contributor.author	Cui, Matthew
dc.date.accessioned	2020-05-21T19:31:01Z
dc.date.available	2020-05-21T19:31:01Z
dc.date.issued	2017-10-02
dc.identifier.citation	RADECS 2017 Radiation Effects on Components and Systems (RADECS) Conference, Geneva, Switzerland, October 2-6, 2017	en_US
dc.identifier.clearanceno	17-4847
dc.identifier.uri	http://hdl.handle.net/2014/48586
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017	en_US
dc.title	SEE testing of the Snapdragon 820: on-site annealing and POP challenges	en_US
dc.type	Presentation	en_US