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Destructive single-events and latchup in radiation-hardened switching regulators

Destructive single-events and latchup in radiation-hardened switching regulators

Vartanian, Sergeh; Allen, Gregory R.; Irom, Farokh; Scheick, Leif Z.; Hart, Shirley; van Vonno, Nick W.; Pearce, Larry
URI: http://hdl.handle.net/2014/48580
Date: 2017-10-02
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017
Citation: RADECS 2017 Radiation Effects on Components and Systems (RADECS) Conference, Geneva, Switzerland, October 2-6, 2017

Abstract:

Single-event destructive behavior and latchup has been observed in two separate radiation hardened switching regulators. We discuss the test conditions and observed results.

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