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Lessons and Recommendations for Board-Level Testing with Protons

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dc.contributor.author Guertin, Steven M.
dc.date.accessioned 2020-05-14T22:56:33Z
dc.date.available 2020-05-14T22:56:33Z
dc.date.issued 2018-08-04
dc.identifier.citation Small Satellites Conference (SmallSat 2018), Logan, Utah, August 4 - 9, 2018 en_US
dc.identifier.clearanceno 18-3370
dc.identifier.uri http://hdl.handle.net/2014/48473
dc.description.abstract Protons with sufficiently high energy, provided in a broad field covering on the order of 0.1m2 can be used to perform board-level testing for single event effects (SEE). NASA has used this approach for board-level testing over the last 20 years. Although many difficulties inherent in SEE testing are simplified when using a board-level test, including reduced cost, the method is inherently risky because of the limited value of the collected data and the potential to make critical mistakes when performing SEE testing this way, leading to data of less value. Historically, NASA’s approach to proton board-level testing has been limited to lower criticality applications. However, with users both inside and outside NASA using this method for higher levels of mission assurance, we have put together a set of lessons and recommendations to improve the value of data collected using this method. Focus areas covered include test preparation, test execution, and interpretation of results. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2018 en_US
dc.title Lessons and Recommendations for Board-Level Testing with Protons en_US
dc.type Preprint en_US


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