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Life Qualification of Hall Thrusters By Analysis and Test

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dc.contributor.author Polk, James E.
dc.contributor.author Brophy, John R.
dc.date.accessioned 2020-05-05T21:11:41Z
dc.date.available 2020-05-05T21:11:41Z
dc.date.issued 2018-05-14
dc.identifier.citation Space Propulsion 2018, Seville, Spain, May 14 - 18, 2018 en_US
dc.identifier.clearanceno 18-2253
dc.identifier.uri http://hdl.handle.net/2014/48275
dc.description.abstract High power Hall thrusters under development for deep space robotic and human exploration missions have demanding lifetime and operational requirements that make thruster life qualification challenging. The required burn times make it infeasible to conduct multiple tests with durations exceeding the life requirement, and complex wearout phenomena and the need for power throttling during missions complicate analyses and testing. The traditional qualification approach, a single life test that typically demonstrates 50 to 100% margin on the required lifetime, does not provide enough information to demonstrate low failure risk. It is a weak source of statistical information about the location of the peak in the failure probability distribution and provides no information on the width of the distribution. Testing does provide information that can be used to validate physics-based models of failure processes, however, and the combination can be used to assess mission risk. Validated, conservative, deterministic analysis can be used to demonstrate that most failure processes have such large margins that more detailed analysis is unnecessary. For a subset of the failure modes a more detailed probabilistic analysis is required. Pole erosion in a 12.5 kW Hall thruster is used as a detailed example of this qualification process. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2018 en_US
dc.title Life Qualification of Hall Thrusters By Analysis and Test en_US
dc.type Preprint en_US


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