Radiation Performance of Memory Technologies for Space Applications

Guertin, Steven M.; Yang-Scharlotta, Jean; Some, Raphael

Radiation Performance of Memory Technologies for Space Applications

Guertin, Steven M.; Yang-Scharlotta, Jean; Some, Raphael

URI: http://hdl.handle.net/2014/48057

Date: 2018-03-12

Keywords: SEE; TID; Radiation; MRAM; DRAM

Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2018

Citation: GOMACTech 2018, Miami, Florida, March 12-15, 2018

Abstract:

MRAM and DRAM memory technologies identified for possible radiation hardening were investigated for memory-array- and controller-level radiation sensitivity. TID and SEE performance of memory arrays and associated cells is good, but with some questions about viability of hardening of problematic control circuitry. Control-circuitry-related SEE problems are highlighted. TID data are focused on memory arrays only.

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