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Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators

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dc.contributor.author Bozovich, Amanda
dc.contributor.author Irom, Farokh
dc.date.accessioned 2019-07-02T17:56:39Z
dc.date.available 2019-07-02T17:56:39Z
dc.date.issued 2017-07-07
dc.identifier.citation 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, Louisiana, July 17-21, 2017 en_US
dc.identifier.clearanceno CL#17-3580
dc.identifier.uri http://hdl.handle.net/2014/46386
dc.description.abstract This data compendium reports single event transient (SET) and total ionizing dose (TID) test results for commonly used commercial-off-the-shelf (COTS) and radiation hardened voltage comparators targeted for possible use in space-based missions. Interesting trends in the variability of the radiation performance of these devices due to differences in lot date codes, manufacturers, circuit design, and test conditions are analyzed herein. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017 en_US
dc.title Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators en_US
dc.type Preprint en_US


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