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Heating and Thermal Control of Brazing Technique to Break Contamination Path for Potential Mars Sample Return

Show simple item record Bao, Xiaoqi Badescu, Mircea Sherrit, Stewart Bar-Cohen, Yoseph Campos, Sergio 2019-06-12T17:35:29Z 2019-06-12T17:35:29Z 2017-03-26
dc.identifier.citation 2017 SPIE Smart Structures and Materials/NDE Symposium, Portland, Oregon, March 25-29, 2017 en_US
dc.identifier.clearanceno CL#17-1125
dc.description.abstract The potential return of Mars sample material is of great interest to the planetary science community, as it would enable extensive analysis of samples with highly sensitive laboratory instruments. It is important to make sure such a mission concept would not bring any living microbes, which may possibly exist on Mars, back to Earth’s environment. In order to ensure the isolation of Mars microbes from Earth’s Atmosphere, a brazing sealing and sterilizing technique was proposed to break the Mars-to-Earth contamination path. Effectively, heating the brazing zone in high vacuum space and controlling the sample temperature for integrity are key challenges to the implementation of this technique. The break-the-chain procedures for container configurations, which are being considered, were simulated by multi-physics finite element models. Different heating methods including induction and resistive/radiation were evaluated. The temperature profiles of Martian samples in a proposed container structure were predicted. The results show that the sealing and sterilizing process can be controlled such that the samples temperature is maintained below the level that may cause damage, and that the brazing technique is a feasible approach to breaking the contamination path. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017 en_US
dc.title Heating and Thermal Control of Brazing Technique to Break Contamination Path for Potential Mars Sample Return en_US
dc.type Preprint en_US

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