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Single event testing of SDRAM, DDR2 and DDR3 memories

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dc.contributor.author Guertin, Steven M.
dc.contributor.author Amrbar, Mehran
dc.date.accessioned 2019-05-28T21:30:22Z
dc.date.available 2019-05-28T21:30:22Z
dc.date.issued 2016-07-11
dc.identifier.citation 2016 Nuclear And Space Radiation Effects Conference, Portland, Oregon, July 11-15, 2016 en_US
dc.identifier.clearanceno 16-3581
dc.identifier.uri http://hdl.handle.net/2014/46173
dc.description.abstract SEE test results are presented for SDRAM, DDR2, and DDR3. No tested devices exhibited SEL. SBUs were observed, but no MBUs were observed in data words. SEFI data were taken at low and high speed. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2016 en_US
dc.title Single event testing of SDRAM, DDR2 and DDR3 memories en_US
dc.type Preprint en_US


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