JPL Technical Report Server

Zernike wavefront sensor (ZWFS) development for Low Order Wavefront Sensing (LOWFS)

Show simple item record Wang, Xu Shi, Fang Wallace, J. Kent 2019-05-22T17:52:56Z 2019-05-22T17:52:56Z 2016-06-26
dc.identifier.citation SPIE Astronomical Telescopes + Instrumentation 2016, Edinburgh, Scotland, June 26 - July 1, 2016 en_US
dc.identifier.clearanceno 16-2760
dc.description.abstract ZWFS is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIRST for its sensitivity, accuracy, and its ease of integration with the starlight rejection mask. In this paper, we present the development of ZWFS sensor, including the algorithm description, sensitivity analysis, and some early experimental model validation results from a fabricated ZWFS phase mask on a stand-alone LOWFS testbed. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2016 en_US
dc.subject Wavefront sensing en_US
dc.subject Zernike phase contrast en_US
dc.subject WFIRST en_US
dc.subject LOWFS en_US
dc.title Zernike wavefront sensor (ZWFS) development for Low Order Wavefront Sensing (LOWFS) en_US
dc.type Preprint en_US

Files in this item

This item appears in the following Collection(s)

Show simple item record



My Account