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Board level proton testing book of knowledge for NASA Electronic Parts and Packaging Program

Show simple item record Guertin, Steven M. 2018-02-08T22:52:20Z 2018-02-08T22:52:20Z 2017-11-01
dc.identifier.citation Jet Propulsion Laboratory, Pasadena, California, November 1, 2017 en_US
dc.description.abstract This book of knowledge (BoK) provides a critical review of the benefits and difficulties associated with using proton irradiation as a means of exploring the radiation hardness of commercial-off-the-shelf (COTS) systems. This work was developed for the NASA Electronic Parts and Packaging (NEPP) Board Level Testing for the COTS task. The fundamental findings of this BoK are the following. The board-level test method can reduce the worst case estimate for a board’s single-event effect (SEE) sensitivity compared to the case of no test data, but only by a factor of ten. The estimated worst case rate of failure for untested boards is about 0.1 SEE/board-day. By employing the use of protons with energies near or above 200 MeV, this rate can be safely reduced to 0.01 SEE/board-day, with only those SEEs with deep charge collection mechanisms rising this high. For general SEEs, such as static random-access memory (SRAM) upsets, single-event transients (SETs), single-event gate ruptures (SEGRs), and similar cases where the relevant charge collection depth is less than 10 µm, the worst case rate for SEE is below 0.001 SEE/board-day. Note that these bounds assume that no SEEs are observed during testing. When SEEs are observed during testing, the board-level test method can establish a reliable event rate in some orbits, though all established rates will be at or above 0.001 SEE/board-day. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017 en_US
dc.relation.ispartofseries JPL Pub 17-7;
dc.subject electronic parts en_US
dc.subject reliability en_US
dc.subject parts testing en_US
dc.subject board level testing en_US
dc.subject microcircuits en_US
dc.subject COTS en_US
dc.title Board level proton testing book of knowledge for NASA Electronic Parts and Packaging Program en_US
dc.type Technical Report en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US

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