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Radiation test results for common CubeSat microcontrollers and microprocessors

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dc.contributor.author Guertin, Steven M.
dc.contributor.author Amrbar, Mehran
dc.contributor.author Vartanian, Sergeh
dc.date.accessioned 2017-07-26T16:19:45Z
dc.date.available 2017-07-26T16:19:45Z
dc.date.issued 2015-07-13
dc.identifier.citation 2015 Nuclear and Space Radiation Effects Conference, Boston, Massachusetts, July 13-17, 2015 en_US
dc.identifier.clearanceno 15-2762
dc.identifier.uri http://hdl.handle.net/2014/45739
dc.description.abstract SEL, SEU and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2015 en_US
dc.title Radiation test results for common CubeSat microcontrollers and microprocessors en_US
dc.type Presentation en_US


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