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Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory

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dc.contributor.author Miyahira, Tetsuo F.
dc.contributor.author Irom, Farokh
dc.date.accessioned 2014-12-11T23:59:22Z
dc.date.available 2014-12-11T23:59:22Z
dc.date.issued 2008-07-14
dc.identifier.citation 2008 IEEE Nuclear and Space Radiation Effects Conference, Tucson, Arizona, July 14-18, 2008 en_US
dc.identifier.clearanceno 08-2240
dc.identifier.uri http://hdl.handle.net/2014/44841
dc.description.abstract This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008 en_US
dc.title Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory en_US
dc.type Preprint en_US


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