Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory

Miyahira, Tetsuo F.; Irom, Farokh

dc.contributor.author	Miyahira, Tetsuo F.
dc.contributor.author	Irom, Farokh
dc.date.accessioned	2014-12-11T23:59:22Z
dc.date.available	2014-12-11T23:59:22Z
dc.date.issued	2008-07-14
dc.identifier.citation	2008 IEEE Nuclear and Space Radiation Effects Conference, Tucson, Arizona, July 14-18, 2008	en_US
dc.identifier.clearanceno	08-2240
dc.identifier.uri	http://hdl.handle.net/2014/44841
dc.description.abstract	This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008	en_US
dc.title	Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory	en_US
dc.type	Preprint	en_US