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Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory

Results of single-event latchup measurements conducted by the Jet Propulsion Laboratory

Miyahira, Tetsuo F.; Irom, Farokh
URI: http://hdl.handle.net/2014/44841
Date: 2008-07-14
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008
Citation: 2008 IEEE Nuclear and Space Radiation Effects Conference, Tucson, Arizona, July 14-18, 2008

Abstract:

This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.

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