Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008
Citation:2008 IEEE Nuclear and Space Radiation Effects Conference, Tucson, Arizona, July 14-18, 2008
Abstract:
This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.