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Metrology optical power budgeting in SIM using statistical analysis techniques

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dc.contributor.author Kuan, Gary M
dc.date.accessioned 2014-12-10T00:44:21Z
dc.date.available 2014-12-10T00:44:21Z
dc.date.issued 2008-06-23
dc.identifier.citation SPIE Conference on Astronomical Instrumentation, Marseille, France, June 23 - 28, 2008 en_US
dc.identifier.clearanceno 08-2025
dc.identifier.uri http://hdl.handle.net/2014/44840
dc.description.abstract The Space Interferometry Mission (SIM) is a space-based stellar interferometry instrument, consisting of up to three interferometers, which will be capable of micro-arc second resolution. Alignment knowledge of the three interferometer baselines requires a three-dimensional, 14-leg truss with each leg being monitored by an external metrology gauge. In addition, each of the three interferometers requires an internal metrology gauge to monitor the optical path length differences between the two sides. Both external and internal metrology gauges are interferometry based, operating at a wavelength of 1319 nanometers. Each gauge has fiber inputs delivering measurement and local oscillator (LO) power, split into probe-LO and reference-LO beam pairs. These beams experience power loss due to a variety of mechanisms including, but not restricted to, design efficiency, material attenuation, element misalignment, diffraction, and coupling efficiency. Since the attenuation due to these sources may degrade over time, an accounting of the range of expected attenuation is needed so an optical power margin can be book kept. A method of statistical optical power analysis and budgeting, based on a technique developed for deep space RF telecommunications, is described in this paper and provides a numerical confidence level for having sufficient optical power relative to mission metrology performance requirements. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008 en_US
dc.subject stellar interferometry en_US
dc.subject optical metrology en_US
dc.subject optical power budget en_US
dc.subject statistical analysis en_US
dc.title Metrology optical power budgeting in SIM using statistical analysis techniques en_US
dc.type Preprint en_US


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