Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization

Lay, Oliver P.; Dubovitsky, Serge; Shaddock, Daniel A.; Ware, Brent; Woodruff, Christopher S.

Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization

Lay, Oliver P.; Dubovitsky, Serge; Shaddock, Daniel A.; Ware, Brent; Woodruff, Christopher S.

URI: http://hdl.handle.net/2014/44826

Date: 2008-06-23

Keywords: laser metrology

Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008

Citation: SPIE Conference on Astronomical Instrumentation, Marseille, France, June 23 - 28, 2008

Abstract:

Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.

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