Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008
Citation:SPIE Conference on Astronomical Instrumentation, Marseille, France, June 23 - 28, 2008
Abstract:
Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.