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ELDRS characterization for a very high dose mission

Show simple item record Harris, Richard D. McClure, Steven S. Rax, Bernard G. Kenna, Aaron J. Thorbourn, Dennis O. Clark, Karla B. Yan, Tsun-Yee 2014-09-24T19:04:45Z 2014-09-24T19:04:45Z 2010-07-20
dc.identifier.citation 2010 IEEE Nuclear and Space Radiation Effects Workshop, Denver, Colorado, July 19–23, 2010 en_US
dc.identifier.clearanceno 10-2738
dc.description.abstract Evaluation of bipolar linear parts which may have Enhanced Low Dose Rate Sensitivity (ELDRS) is problematic for missions that have very high dose radiation requirements. The accepted standards for evaluating parts that display ELDRS require testing at a very low dose rate which could be prohibitively long for very high dose missions. In this work, a methodology for ELDRS characterization of bipolar parts for mission doses up to 1 Mrad(Si) is evaluated. The procedure employs an initial dose rate of 0.01 rad(Si)/s to a total dose of 50 krad(Si) and then changes to 0.04 rad(Si)/s to a total dose of 1 Mrad(Si). This procedure appears to work well. No change in rate of degradation with dose has been observed when the dose rate is changed from 0.01 to 0.04 rad(Si)/s. This is taken as an indication that the degradation due to the higher dose rate is equivalent to that at the lower dose rate at the higher dose levels, at least for the parts studied to date. In several cases, significant parameter degradation or functional failure not observed at HDR was observed at fairly high total doses (50 to 250 krad(Si)) at LDR. This behavior calls into question the use of dose rate trend data and enhancement factors to predict LDR performance. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2010 en_US
dc.subject Bipolar en_US
dc.subject Radiation Damage en_US
dc.subject TID en_US
dc.title ELDRS characterization for a very high dose mission en_US
dc.type Preprint en_US

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