TID test results for 4th generation iPad™

Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A.

dc.contributor.author	Guertin, S. M.
dc.contributor.author	Allen, G. R.
dc.contributor.author	McClure, S. S.
dc.contributor.author	LaBel, K. A.
dc.date.accessioned	2014-02-25T00:12:11Z
dc.date.available	2014-02-25T00:12:11Z
dc.date.issued	2013-07-09
dc.identifier.citation	2013 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2013), San Francisco, California, July 8-12, 2013	en_US
dc.identifier.clearanceno	CL#13-2523
dc.identifier.uri	http://hdl.handle.net/2014/44330
dc.description.abstract	TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2013	en_US
dc.subject	SEE	en_US
dc.subject	Charge Circuit Failure	en_US
dc.subject	Display Failure	en_US
dc.subject	MSL	en_US
dc.subject	Curiosity	en_US
dc.title	TID test results for 4th generation iPad™	en_US
dc.type	Preprint	en_US