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TID test results for 4th generation iPad™

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dc.contributor.author Guertin, S. M.
dc.contributor.author Allen, G. R.
dc.contributor.author McClure, S. S.
dc.contributor.author LaBel, K. A.
dc.date.accessioned 2014-02-25T00:12:11Z
dc.date.available 2014-02-25T00:12:11Z
dc.date.issued 2013-07-09
dc.identifier.citation 2013 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2013), San Francisco, California, July 8-12, 2013 en_US
dc.identifier.clearanceno CL#13-2523
dc.identifier.uri http://hdl.handle.net/2014/44330
dc.description.abstract TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2013 en_US
dc.subject SEE en_US
dc.subject Charge Circuit Failure en_US
dc.subject Display Failure en_US
dc.subject MSL en_US
dc.subject Curiosity en_US
dc.title TID test results for 4th generation iPad™ en_US
dc.type Preprint en_US


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