Recent power MOSFET test results

Scheick, Leif Z.; Gauthier, Brian; Triggs, Brian

dc.contributor.author	Scheick, Leif Z.
dc.contributor.author	Gauthier, Brian
dc.contributor.author	Triggs, Brian
dc.date.accessioned	2013-10-17T20:39:13Z
dc.date.available	2013-10-17T20:39:13Z
dc.date.issued	2011-07-27
dc.identifier.citation	IEEE Nuclear and Space Radiation Effects Conference (NSREC), Las Vegas, Nevada, July 25, 2011	en_US
dc.identifier.clearanceno	11-2755
dc.identifier.uri	http://hdl.handle.net/2014/43881
dc.description.abstract	The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.	en_US
dc.subject	Single Event Gate Rupture (SEGR)	en_US
dc.subject	Single Event Burnout (SEB).	en_US
dc.subject	radiation hard power solutions	en_US
dc.title	Recent power MOSFET test results	en_US
dc.type	Preprint	en_US