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Recent power MOSFET test results

Show simple item record Scheick, Leif Z. Gauthier, Brian Triggs, Brian 2013-10-17T20:39:13Z 2013-10-17T20:39:13Z 2011-07-27
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference (NSREC), Las Vegas, Nevada, July 25, 2011 en_US
dc.identifier.clearanceno 11-2755
dc.description.abstract The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. en_US
dc.subject Single Event Gate Rupture (SEGR) en_US
dc.subject Single Event Burnout (SEB). en_US
dc.subject radiation hard power solutions en_US
dc.title Recent power MOSFET test results en_US
dc.type Preprint en_US

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