JPL Technical Report Server

Recent power MOSFET test results

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dc.contributor.author Scheick, Leif Z.
dc.contributor.author Gauthier, Brian
dc.contributor.author Triggs, Brian
dc.date.accessioned 2013-10-17T20:39:13Z
dc.date.available 2013-10-17T20:39:13Z
dc.date.issued 2011-07-27
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference (NSREC), Las Vegas, Nevada, July 25, 2011 en_US
dc.identifier.clearanceno 11-2755
dc.identifier.uri http://hdl.handle.net/2014/43881
dc.description.abstract The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. en_US
dc.subject Single Event Gate Rupture (SEGR) en_US
dc.subject Single Event Burnout (SEB). en_US
dc.subject radiation hard power solutions en_US
dc.title Recent power MOSFET test results en_US
dc.type Preprint en_US


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