Evaluation of an accelerated ELDRS test using molecular hydrogen

Pease, Ronald L.; Adell, Philippe C.; Rax, Bernard; McClure, Steven; Barnaby, Hugh J.; Kruckmeyer, Kirby

Evaluation of an accelerated ELDRS test using molecular hydrogen

Pease, Ronald L.; Adell, Philippe C.; Rax, Bernard; McClure, Steven; Barnaby, Hugh J.; Kruckmeyer, Kirby

URI: http://hdl.handle.net/2014/43868

Date: 2011-07-19

Keywords: dose rate; enhanced low-dose rate sensitivity (ELDRS); radiation effects; total ionizing dose; hydrogen; bipolar linear circuits

Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.

Citation: IEEE Nuclear and Space Radiation Effects Conference (NSREC), Las Vegas, Nevada, July 25, 2011

Abstract:

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened “ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative.

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