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Single event rates for devices sensitive to particle energy

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dc.contributor.author Edmonds, L. D.
dc.contributor.author Scheick, L. Z.
dc.contributor.author Banker, M. W. en_US
dc.date.accessioned 2013-05-29T15:21:36Z
dc.date.available 2013-05-29T15:21:36Z
dc.date.issued 2012-07-16
dc.identifier.citation IEEE Nuclear & Space Radiation Effects Conference (NSREC 2012), Miami, Florida, July 16-20, 2012. en_US
dc.identifier.clearanceno 12-4602
dc.identifier.uri http://hdl.handle.net/2014/43181
dc.description.abstract Single event rates (SER) can include contributions from low-energy particles such that the linear energy transfer (LET) is not constant. Previous work found that the environmental description that is most relevant to the low-energy contribution to the rate is a “stopping rate per unit volume” even when the physical mechanisms for a single-event effect do not require an ion to stop in some device region. Stopping rate tables are presented for four heavy-ion environments that are commonly used to assess device suitability for space applications. A conservative rate estimate utilizing limited test data is derived, and the example of SEGR rate in a power MOSFET is presented. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012. en_US
dc.subject single-event gate rupture (SEGR) en_US
dc.subject design case devices en_US
dc.subject conservative rate en_US
dc.subject particle energy en_US
dc.subject linear energy transfer en_US
dc.title Single event rates for devices sensitive to particle energy en_US
dc.type Preprint en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US


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