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Compendium of single-event latchup and total ionizing dose test results of commercial analog to digital converters

Compendium of single-event latchup and total ionizing dose test results of commercial analog to digital converters

Irom, Farokh; Agarwal, Shri G.
URI: http://hdl.handle.net/2014/42689
Date: 2012-07-16
Keywords: A/D converter (ADC); critical components; electronic hardware
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2012), Miami, Florida, July 16-20, 2012

Abstract:

This paper reports single-event latchup and total dose results for a variety of analog to digital converters targeted for possible use in NASA spacecraft’s. The compendium covers devices tested over the last 15 years.

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