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Compendium of recent test results of single event effects conducted by the Jet Propulsion Laboratory

Compendium of recent test results of single event effects conducted by the Jet Propulsion Laboratory

Allen, Gregory R.; Guertin, Steven M.; Scheick, Leif Z.; Irom, Farokh; Zajac, Stephanie
URI: http://hdl.handle.net/2014/42688
Date: 2012-07-16
Keywords: microelectronic technologies; Single Event Effects (SEE); reliability; single event functional interrupt (SEFI)
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation: IEEE Nuclear and Space Radiation Effects Conference, Miami, Florida, July 16-20, 2012.

Abstract:

This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.

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