Keywords:microelectronic technologies; Single Event Effects (SEE); reliability; single event functional interrupt (SEFI)
Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation:IEEE Nuclear and Space Radiation Effects Conference, Miami, Florida, July 16-20, 2012.
Abstract:
This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.