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Analysis of SDRAM SEFIs

Analysis of SDRAM SEFIs

Guertin, Steven M.
URI: http://hdl.handle.net/2014/42656
Date: 2012-04-02
Keywords: Single Event Functionality Interrupt (SEFI); Juno; data visualization; single event effects (SEE); block error; multi-bit error
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation: Single Event Effects Symposium (SEE), La Jolla, California, April 3-5, 2012

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