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Status on radiation qualification methods for SOC devices
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Status on radiation qualification methods for SOC devices
Guertin, Steven M.
URI:
http://hdl.handle.net/2014/42172
Date:
2011-06-29
Keywords:
Electronics and Electrical Engineering (SEE) Test Methods; Test Methods; Radiation Hardening by Design (RHBD); System-On-Chip (SoC) devices
Publisher:
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Citation:
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011, Greenbelt, Maryland, June 28-29, 2011
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JPL TRS 1992+
JPL TRS 1992+
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