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Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Allen, Gregory
URI: http://hdl.handle.net/2014/41947
Date: 2011-12
Keywords: Reconfigurable Field-Programmable Gate Array (FPGA); Xilinx Single-Event Effects (SEE) Test Consortium; single-event upset (SEU); single-event functional interrupt (SEFI)
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.

Abstract:

The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).

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