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ASIC fault coverage requirements for space application

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dc.contributor.author Heidecker, Jason
dc.date.accessioned 2012-01-10T23:19:00Z
dc.date.available 2012-01-10T23:19:00Z
dc.date.issued 2011-11
dc.identifier.uri http://hdl.handle.net/2014/41935
dc.description.abstract Testable designs of digital application-specific integrated circuits (ASICs) are essential to obtaining highreliability “Hi-Rel” devices. At present, there are no quantifiable requirements in MIL-PRF-38535 or MIL-STD-883 for ASIC test and testability. The purpose of this task is to provide background information regarding ASIC test, testability, and fault coverage, along with a recommendation regarding the level of fault coverage needed to achieve a specified level of reliability for a specified mission duration. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 11-10 en_US
dc.subject digital application-specific integrated circuits (ASICs) en_US
dc.subject testability en_US
dc.subject fault coverage en_US
dc.subject reliability en_US
dc.subject defect detection en_US
dc.title ASIC fault coverage requirements for space application en_US
dc.type Technical Report en_US
dc.subject.NASATaxonomy Spacecraft Instrumentation and Astrionics en_US


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