Abstract:
Testable designs of digital application-specific integrated circuits (ASICs) are essential to obtaining highreliability “Hi-Rel” devices. At present, there are no quantifiable requirements in MIL-PRF-38535 or MIL-STD-883 for ASIC test and testability. The purpose of this task is to provide background information regarding ASIC test, testability, and fault coverage, along with a recommendation regarding the level of fault coverage needed to achieve a specified level of reliability for a specified mission duration.
