Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2007.
Citation:IEEE Aerospace Conference, Big Sky, Montana, March 3-10, 2007.
Abstract:
This paper descnbes an overview of the precision environment test enclosure for testing the structures, a metrology system for absolute measurement at the micron level and the formulation of a modeling methodology that integrates the measurement of aperture components or subsystems w1th models for direct validation.
