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Evaluation of an accelerated ELDRS test using molecular hydrogen

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dc.contributor.author Adell, Philippe
dc.contributor.author Rax, Bernard
dc.contributor.author McClure, Steve
dc.contributor.author Barnaby, Hugh
dc.contributor.author Pease, Ron
dc.date.accessioned 2010-11-10T17:18:12Z
dc.date.available 2010-11-10T17:18:12Z
dc.date.issued 2010-10
dc.identifier.uri http://hdl.handle.net/2014/41673
dc.description.abstract An accelerated total ionizing dose (TID) hardness assurance test for enhanced low-dose-rate sensitive (ELDRS) bipolar linear circuits, using high-dose-rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study, several radiation hardened “ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative. Radiation hardness assurance implications are discussed. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2010. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 10-17 en_US
dc.subject enhanced low dose rate sensitivity en_US
dc.subject hydrogen contamination en_US
dc.subject linear circuits en_US
dc.subject total doses en_US
dc.subject interface traps en_US
dc.title Evaluation of an accelerated ELDRS test using molecular hydrogen en_US
dc.type Technical Report en_US


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