Abstract:
An accelerated total ionizing dose (TID) hardness assurance test for enhanced low-dose-rate sensitive (ELDRS) bipolar linear circuits, using high-dose-rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study, several radiation hardened
“ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative. Radiation hardness assurance implications are discussed.
