JPL Technical Report Server

Commercial Sensor Survey Fiscal Year 2009 master compendium radiation test report

Show simple item record Becker, Heidi N. Alexander, James W. Dolphin, Michael D. Eisenman, Allan R. Salomon, Phil M. Selva, Luis E. Thorbourn, Dennis O. 2010-01-06T00:24:53Z 2010-01-06T00:24:53Z 2009-10
dc.description.abstract The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible-wavelength imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive, low-power, commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07), and three sensors were selected and tested for total ionizing dose (TID) and displacement damage dose (DDD) tolerance in fiscal year 2008 (FY08). The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. The commercial CMOS sensors tested under the task in FY08 showed very promising response to typical outreach and survey camera TID and DDD levels. In fiscal year 2009 (FY09), the survey was broadened to include two additional, similar sensor products. This compendium provides results for all radiation testing performed on the Micron and OmniVision sensors that were selected for radiation tolerance testing in FY08 and FY09. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2009. en_US
dc.relation.ispartofseries JPL Pub en_US
dc.relation.ispartofseries 09-25 en_US
dc.subject sensors en_US
dc.subject space radiation en_US
dc.subject cameras en_US
dc.title Commercial Sensor Survey Fiscal Year 2009 master compendium radiation test report en_US
dc.type Technical Report en_US

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