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Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

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dc.contributor.author Adell, Philippe
dc.contributor.author Rax, Bernard
dc.contributor.author McClure, Steve
dc.contributor.author Barnaby, Hugh
dc.contributor.author Chen, Jie
dc.contributor.author Pease, Ron
dc.date.accessioned 2010-01-06T00:24:28Z
dc.date.available 2010-01-06T00:24:28Z
dc.date.issued 2009-10
dc.identifier.uri http://hdl.handle.net/2014/41469
dc.description.abstract High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semi-conductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. The technology dependence and the viability of this technique are qualitatively explored using a physical model describing the dose rate response and the effect of hydrogen in bipolar technologies. The model uses four core processes: 1) space charge effects, 2) free electron/hole pair recombination, hole-hydrogen defect reactions in the oxides and 4) proton depassivation of dangling bonds at the Si/SiO2 interface. Radiation hardness assurance implications are discussed. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2009. en_US
dc.relation.ispartofseries JPL Pub en_US
dc.relation.ispartofseries 09-24 en_US
dc.subject enhanced low dose rate sensitivity en_US
dc.subject hydrogen contamination en_US
dc.subject linear circuits en_US
dc.subject total dose en_US
dc.subject interface traps en_US
dc.title Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits en_US
dc.type Technical Report en_US


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