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Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes.

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dc.contributor.author Hays, C. C.
dc.contributor.author Newell, J. M.
dc.contributor.author MacNeal, P. D.
dc.contributor.author Ruiz, R. P.
dc.contributor.author Holmes, W. A.
dc.contributor.author Yun, M.
dc.contributor.author Mulder, J. L.
dc.contributor.author Koch, T. C.
dc.contributor.author Bock, J. J.
dc.contributor.author Lange, A. E.
dc.date.accessioned 2009-12-24T15:56:37Z
dc.date.available 2009-12-24T15:56:37Z
dc.date.issued 2005-11-28
dc.identifier.citation 2005 Fall Meeting of the Materials Research Society, Symposium Q: Degradation Processes in Nanostructured Materials, Boston, Massachusetts, November 29, 2005 en_US
dc.identifier.clearanceno 08-3686
dc.identifier.uri http://hdl.handle.net/2014/41463
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. en_US
dc.subject nanotechnology en_US
dc.subject fatigue en_US
dc.subject thin films en_US
dc.subject bolometers en_US
dc.title Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes. en_US
dc.type Presentation en_US


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