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Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes.

Low-cycle fatigue and dynamic fracture in gold thin films on SiN supported membranes.

Hays, C. C.; Newell, J. M.; MacNeal, P. D.; Ruiz, R. P.; Holmes, W. A.; Yun, M.; Mulder, J. L.; Koch, T. C.; Bock, J. J.; Lange, A. E.
URI: http://hdl.handle.net/2014/41463
Date: 2005-11-28
Keywords: nanotechnology; fatigue; thin films; bolometers
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.
Citation: 2005 Fall Meeting of the Materials Research Society, Symposium Q: Degradation Processes in Nanostructured Materials, Boston, Massachusetts, November 29, 2005

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