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Mask design for the Space Interferometry Mission internal metrology

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dc.contributor.author Marx, David
dc.contributor.author Zhao, Feng
dc.contributor.author Korechoff, Robert
dc.date.accessioned 2009-04-08T18:19:26Z
dc.date.available 2009-04-08T18:19:26Z
dc.date.issued 2005-05-23
dc.identifier.citation Conference on Lasers and Electro-Optics (CLEO), Baltimore, Maryland, May 23-27, 2005. en_US
dc.identifier.clearanceno 05-1247
dc.identifier.uri http://hdl.handle.net/2014/41167
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. en_US
dc.subject Space Interferometry Mission (SIM) en_US
dc.subject internal metrology en_US
dc.subject diffraction en_US
dc.subject interferometry en_US
dc.title Mask design for the Space Interferometry Mission internal metrology en_US
dc.type Presentation en_US


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