dc.contributor.author |
Nguyen, D. N. |
|
dc.contributor.author |
Guertin, S. M. |
|
dc.contributor.author |
Patterson, J. D. |
|
dc.date.accessioned |
2009-03-19T17:11:23Z |
|
dc.date.available |
2009-03-19T17:11:23Z |
|
dc.date.issued |
2005-09-19 |
|
dc.identifier.citation |
Radiation and Its Effects on Components and Systems, Sept. 19-23 2005 PW9-1-PW9-4 doi: 10.1109/RADECS.2005.4365650 |
en_US |
dc.identifier.clearanceno |
05-2393 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/41133 |
|
dc.description.abstract |
A series of total ionizing dose (TID) measurements were performed on commercial hard drives to explore the possible uses of the devices for the high radiation mission, and to help the understanding of the reliability of current hard drive technology. Three different models from three major manufacturers were tested with the aid of a commercial hard drive test system. |
en_US |
dc.description.sponsorship |
NASA/JPL |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
IEEE |
en_US |
dc.subject |
hard discs |
en_US |
dc.subject |
laptop computers |
en_US |
dc.subject |
radiation effects |
en_US |
dc.title |
The effect of total ionizing dose degradation of laptop hard disks |
en_US |
dc.type |
Article |
en_US |