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Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors

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dc.contributor.author Irom, Farokh
dc.contributor.author Farmanesh, F. F.
dc.date.accessioned 2009-03-19T17:05:32Z
dc.date.available 2009-03-19T17:05:32Z
dc.date.issued 2004-12
dc.identifier.citation IEEE Transactions on Nuclear Science, Vol. 51, No. 6, p. 3505-3509, December 2004 en_US
dc.identifier.clearanceno 04-3215
dc.identifier.uri http://hdl.handle.net/2014/41132
dc.description.abstract Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher IEEE en_US
dc.subject cyclotron en_US
dc.subject heavy ion en_US
dc.subject microprocessors en_US
dc.subject silicon-on-insulator en_US
dc.title Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors en_US
dc.type Article en_US


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