Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors

Irom, Farokh; Farmanesh, F. F.

dc.contributor.author	Irom, Farokh
dc.contributor.author	Farmanesh, F. F.
dc.date.accessioned	2009-03-19T17:05:32Z
dc.date.available	2009-03-19T17:05:32Z
dc.date.issued	2004-12
dc.identifier.citation	IEEE Transactions on Nuclear Science, Vol. 51, No. 6, p. 3505-3509, December 2004	en_US
dc.identifier.clearanceno	04-3215
dc.identifier.uri	http://hdl.handle.net/2014/41132
dc.description.abstract	Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	IEEE	en_US
dc.subject	cyclotron	en_US
dc.subject	heavy ion	en_US
dc.subject	microprocessors	en_US
dc.subject	silicon-on-insulator	en_US
dc.title	Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors	en_US
dc.type	Article	en_US