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Tradeoffs in flight design upset mitigation in state of the art FPGAs : hardened by design vs. design level hardening.

Tradeoffs in flight design upset mitigation in state of the art FPGAs : hardened by design vs. design level hardening.

Swift, Gary M.; Roosta, Ramin
URI: http://hdl.handle.net/2014/41057
Date: 2004-09-09
Keywords: FPGA; radiation effects; single event upset; single event latchup
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004.
Citation: Military and Aerospace Programmable Logic Device (MALPD)International Conference, Washington, D.C., September 8-10, 2004

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