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The effects of instrumental elliptical polarization on stellar point spread function fine structure

Show simple item record Carson, Joseph C. Kern, Brian D. Breckinridge, James B. Trauger, John T. 2009-01-06T17:05:29Z 2009-01-06T17:05:29Z 2005-10-03
dc.identifier.citation IAU Colloquium Proceedings Direct Imaging of Exoplanets: Science and Techniques, Nice, France, October 3-7, 2005. en_US
dc.identifier.clearanceno 05-3448
dc.description.abstract We present procedures and preliminary results from a study on the effects of instrumental polarization on the fine structure of the stellar point spread function (PSF). These effects are important to understand because the the aberration caused by instrumental polarization on an otherwise diffraction-limited will likely have have severe consequences for extreme high contrast imaging systems such as NASA's planned Terrestrial Planet Finder (TPF) mission and the proposed NASA Eclipse mission. The report here, describing our efforts to examine these effects, includes two parts: 1) a numerical analysis of the effect of metallic reflection, with some polarization-specific retardation, on a spherical wavefront; 2) an experimental approach for observing this effect, along with some preliminary laboratory results. While the experimental phase of this study requires more fine-tuning to produce meaningful results, the numerical analysis indicates that the inclusion of polarization-specific phase effects (retardation) results in a point spread function (PSF) aberration more severe than the amplitude (reflectivity) effects previously recorded in the literature. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. en_US
dc.subject polarization en_US
dc.subject high angular resolution en_US
dc.subject analytical methods en_US
dc.title The effects of instrumental elliptical polarization on stellar point spread function fine structure en_US
dc.type Preprint en_US

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