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Scaled CMOS technology reliability users guide

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dc.contributor.author White, Mark
dc.contributor.author Chen, Yuan
dc.date.accessioned 2008-04-29T20:10:46Z
dc.date.available 2008-04-29T20:10:46Z
dc.date.issued 2008-05
dc.identifier.uri http://hdl.handle.net/2014/40765
dc.description.abstract This work is sponsored by the NASA Electronic Parts and Packaging (NEPP) Program. One of the objectives of this task is to prepare a body of knowledge guideline document summarizing the CMOS technology scaling impact on CMOS parts and parts reliability for space applications. Scaling impact on parts radiation sensitivity is not addressed in this report. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 08-14 en_US
dc.subject scaling theory en_US
dc.title Scaled CMOS technology reliability users guide en_US
dc.type Technical Report en_US


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