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CMOS active pixel sensor technology and reliability characterization methodology

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dc.contributor.author Chen, Yuan ,
dc.contributor.author Guertin, Steven M.
dc.contributor.author Pain, Bedabrata
dc.contributor.author Kayaii, Sammy
dc.date.accessioned 2007-03-13T22:44:10Z
dc.date.available 2007-03-13T22:44:10Z
dc.date.issued 2006-03-20
dc.identifier.citation Government Microcircuit Applications and Critical Technology Conference, San Diego, California, March 20-23, 2006. en
dc.identifier.clearanceno 06-0252
dc.identifier.uri http://hdl.handle.net/2014/40169
dc.description.abstract This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 835700 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006. en
dc.subject CMOS Active Pixel Sensors en
dc.subject low temperature en
dc.subject imaging sensor reliability en
dc.subject pixel reliability en
dc.subject reliability analysis
dc.title CMOS active pixel sensor technology and reliability characterization methodology en
dc.type Preprint en


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