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CMOS active pixel sensor technology and reliability characterization methodology

CMOS active pixel sensor technology and reliability characterization methodology

Chen, Yuan ,; Guertin, Steven M.; Pain, Bedabrata; Kayaii, Sammy
URI: http://hdl.handle.net/2014/40169
Date: 2006-03-20
Keywords: CMOS Active Pixel Sensors; low temperature; imaging sensor reliability; pixel reliability; reliability analysis
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2006.
Citation: Government Microcircuit Applications and Critical Technology Conference, San Diego, California, March 20-23, 2006.

Abstract:

This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers.

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