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TID, SEE and radiation induced failures in advanced flash memories

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dc.contributor.author Nguyen, Duc N.
dc.contributor.author Scheick, Leif Z.
dc.date.accessioned 2007-03-12T21:22:47Z
dc.date.available 2007-03-12T21:22:47Z
dc.date.issued 2003-11-12
dc.identifier.citation Non-volatile Memory Technology Symposium, San Diego, California, November 12-13, 2003. en
dc.identifier.clearanceno 03-2932
dc.identifier.uri http://hdl.handle.net/2014/40154
dc.description.sponsorship NASA/JPL en
dc.format.extent 3097876 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003. en
dc.subject Total Ioniation Dose (TID) en
dc.subject singel event effects (SEE) en
dc.subject flash memories en
dc.title TID, SEE and radiation induced failures in advanced flash memories en
dc.type Presentation en


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