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Frequency dependence of single-event upset in advanced commerical PowerPC microprocessors.

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dc.contributor.author Irom, Frokh
dc.contributor.author Farmanesh, F. F.
dc.contributor.author Swift, G. M.
dc.contributor.author Johnston, A. H.
dc.date.accessioned 2006-11-28T19:28:33Z
dc.date.available 2006-11-28T19:28:33Z
dc.date.issued 2004-07-19
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference, Altlanta, Georgia, June 19-20, 2004. en
dc.identifier.clearanceno 04-2149
dc.identifier.uri http://hdl.handle.net/2014/39993
dc.description.abstract This paper examines single-event upsets in advanced commercial SO1 microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SO1 processors with feature sizes of 0.18 μ and two different core voltages. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 2243907 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. en
dc.subject single-event upset (SEU) en
dc.subject microprocessors
dc.subject radiation testing
dc.title Frequency dependence of single-event upset in advanced commerical PowerPC microprocessors. en
dc.type Preprint en


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