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Sub-nanometer level model validation of the SIM interferometer

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dc.contributor.author Korechoff, Robert P.
dc.contributor.author Hoppe, Daniel
dc.contributor.author Wang, Xu
dc.date.accessioned 2006-11-28T19:10:23Z
dc.date.available 2006-11-28T19:10:23Z
dc.date.issued 2004-06-21
dc.identifier.citation SPIE New Frontiers in Stellar Interferometry, Glasgow, Scotland, June 21-25, 2004. en
dc.identifier.clearanceno 04-1568
dc.identifier.uri http://hdl.handle.net/2014/39962
dc.description.abstract The Space Interferometer Mission (SIM) flight instrument will not undergo a full performance, end-to-end system test on the ground due to a number of constraints. Thus, analysis and physics-based models will play a significant role in providing confidence that SIM will meet its science goals on orbit. The various models themselves are validated against the experimental results obtained from the MicroArcsecond Metrology (MAM) testbed adn the Diffraction testbed (DTB). The metric for validation is provided by the SIM astrometric error budget. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 3511565 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. en
dc.subject Space Interferometer Mission (SIM) en
dc.subject MicroArcsecond Metrology (MAM) en
dc.subject modeling en
dc.subject astrometry en
dc.title Sub-nanometer level model validation of the SIM interferometer en
dc.type Preprint en


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