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Preliminary low temperature tests of a digital signal processor

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dc.contributor.author Zebulum, Ricardo S.
dc.contributor.author Ramesham, Rajeshuni
dc.contributor.author Stoica, Adrian
dc.contributor.author Keymeulen, Didier
dc.contributor.author Daud, Taher
dc.contributor.author Sekanina, Lukas
dc.date.accessioned 2006-07-31T16:12:04Z
dc.date.available 2006-07-31T16:12:04Z
dc.date.issued 2005-02-21
dc.identifier.citation IMAPS Advanced Technology Workshop on Reliability of Advanced Electronic Pakages and Devices in Extreme Cold Temperatures, Pasadena, California, February 21-23, 2005. en
dc.identifier.clearanceno IMAPS Advanced Technology Workshop on Reliability of Advanced Electronic Pakages and Devices in Extreme Cold Temperatures, Pasadena, California, February 21-23, 2005.
dc.identifier.clearanceno IMAPS Advanced Technology Workshop on Reliability of Advanced Electronic Pakages and Devices in Extreme Cold Temperatures, Pasadena, California, February 21-23, 2005.
dc.identifier.clearanceno 05-0400
dc.identifier.uri http://hdl.handle.net/2014/39587
dc.description.abstract This paper describes an initial experiment performed to assess the electrical behavior of the Innovative Integration board containing a Digital Signal Processor (DSP) with its JTAG (Blackhawk) connector at low temperatures. The objective of the experiment is to determine the lowest temperature at which the DSP can operate. The DSP was tested at various low-temperatures and a Genetic Algorithm was used as the DSP test program. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 1961925 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. en
dc.subject Digital Signal Processor (DSP) en
dc.subject temperatures en
dc.title Preliminary low temperature tests of a digital signal processor en
dc.type Preprint en


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