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Estimation of cyclic error due to scattering in the internal OPD metrology of the Space Interferometry Mission

Estimation of cyclic error due to scattering in the internal OPD metrology of the Space Interferometry Mission

Tang, Hong; Zhao, Feng
URI: http://hdl.handle.net/2014/39545
Date: 2005-02-14
Keywords: metrology; cyclic error; scattering
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.
Citation: 8th International Symposium on Laser Metrology, Merida, Yucatan, Mexico, February 14-18, 2005.

Abstract:

A common-path laser heterodyne interferometer capable of measuring the internal OPD with accuracy of the order of 10 picometers was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

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