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Experimentally derived resistivity for dielectric samples from the CRRES internal discharge monitor

Experimentally derived resistivity for dielectric samples from the CRRES internal discharge monitor

Green, Nelson W.; Frederickson, A. Robb; Dennison, J. R.
URI: http://hdl.handle.net/2014/39475
Date: 2005-04-04
Keywords: spacecraft charging; electrons; resistivity; Combined Release and Radiation Effects Satellite (CRRES).
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005.
Citation: 9th Spacecraft Charging Technology Conference, Tsukuba, Japan, April 4-8, 2005.

Abstract:

Resistivity values were experimentally determined using charge storage methods for six samples remaining from the construction of the Internal Discharge Monitor (IDM) flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of four to five weeks each in a vacuum of -5x10^-6 torr with an average temperature of -25 °C to simulate a space environment.

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