Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2002.
Citation:SPIE's Astronomical Telescopes and Instrumentation, Waikola, Hawaii, August 22-28, 2002.
Abstract:
An external calibration technique for SIM involves measurement of calibration stars whose positions must already be known to an accuracy of 2 milliarcseconds. We demonstrate a procedure that effectively "bootstraps" calibration star positions from an ab initio catalog to the required accuracy by observing them with the uncalibrated SIM instrument.